Visit Polytec to experience the precision and efficiency of their advanced laser vibrometry technologies for MEMS testing.

Polytec will showcase its MSA-600 Micro System Analyzer, a cutting-edge tool for real-time, high-resolution dynamic response and surface topography measurements. Engineered for exceptional performance, the MSA-600 delivers picometer-level resolution, supports frequencies up to 8 GHz, and offers bandwidth up to 24 MHz. Seamlessly integrated with probe stations for wafer-level testing, this system enables rapid, quantitative measurements that streamline quality control and improve device characterization. Automated scan measurement capabilities produce 3D animations of complex deflection shapes, providing a deeper understanding of MEMS performance.

For advanced applications, Polytec's MSA-650 IRIS system extends functionality with infrared (IR) capability, allowing precise measurements through silicon on encapsulated devices. These innovations empower researchers and industry leaders to achieve accurate, non-contact analysis of vibration and dynamic behavior, driving advancements in MEMS technology.